Вопрос о жизни винча по smart
Форум — Admin
Винчу месяц. Эти показатели ок? А то тупит безумно, буквально вчера начал. Рейд аж развалился и заново синхаться начал.
~# smartctl -a /dev/sda
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-4-amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: WDC WD1000DHTZ-04N21V0
Serial Number: WD-WX51C62H0788
LU WWN Device Id: 5 0014ee 7aaae5670
Firmware Version: 04.06A00
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Jun 3 01:09:13 2013 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 8820) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 100) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x30bd) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 791
3 Spin_Up_Time 0x0027 203 202 021 Pre-fail Always - 2841
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 13
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1213
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 13
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 8
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 6
194 Temperature_Celsius 0x0022 124 117 000 Old_age Always - 26
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 588 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 588 occurred at disk power-on lifetime: 1212 hours (50 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 09 00 e4 e5 Error: UNC 8 sectors at LBA = 0x05e40009 = 98828297
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 08 00 e4 e5 08 00:51:01.479 READ DMA
ec 00 00 00 00 00 a0 08 00:51:01.471 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 00:51:01.471 SET FEATURES [Set transfer mode]
Error 587 occurred at disk power-on lifetime: 1212 hours (50 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 09 00 e4 e5 Error: UNC 8 sectors at LBA = 0x05e40009 = 98828297
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 08 00 e4 e5 08 00:51:01.339 READ DMA
ec 00 00 00 00 00 a0 08 00:51:01.331 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 00:51:01.331 SET FEATURES [Set transfer mode]
Error 586 occurred at disk power-on lifetime: 1212 hours (50 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 09 00 e4 e5 Error: UNC 8 sectors at LBA = 0x05e40009 = 98828297
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 08 00 e4 e5 08 00:51:01.203 READ DMA
ec 00 00 00 00 00 a0 08 00:51:01.195 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 00:51:01.195 SET FEATURES [Set transfer mode]
Error 585 occurred at disk power-on lifetime: 1212 hours (50 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 09 00 e4 e5 Error: UNC 8 sectors at LBA = 0x05e40009 = 98828297
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 08 00 e4 e5 08 00:51:01.063 READ DMA
ec 00 00 00 00 00 a0 08 00:51:01.055 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 00:51:01.055 SET FEATURES [Set transfer mode]
Error 584 occurred at disk power-on lifetime: 1212 hours (50 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 09 00 e4 e5 Error: UNC 8 sectors at LBA = 0x05e40009 = 98828297
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 08 00 e4 e5 08 00:51:00.927 READ DMA
ec 00 00 00 00 00 a0 08 00:51:00.919 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 08 00:51:00.919 SET FEATURES [Set transfer mode]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
